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Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/1674
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dc.contributor.authorMeena P-
dc.contributor.authorBalasubramanian C-
dc.contributor.authorNarayandass K-
dc.contributor.authorMangalaraj D-
dc.date.accessioned2020-09-25T06:49:04Z-
dc.date.available2020-09-25T06:49:04Z-
dc.date.issued1991-
dc.identifier.issn1862-6300-
dc.identifier.urihttps://onlinelibrary.wiley.com/doi/abs/10.1002/pssa.2211250243-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/1674-
dc.description.abstractSince very few reports are available on europium oxide (Eu2O3) thin films, further investigations on structure, aging, and annealing of Eu2O3 films are necessary. Hence the present study deals with the structure, aging, annealing, and dielectric properties of Eu2O3 thin films formed by vacuum evaporation.en_US
dc.language.isoenen_US
dc.publisherWiley/Physica Status Solidi (a), K97-K100en_US
dc.subjectEu2O3thin filmsen_US
dc.titleSTRUCTURE, AGING, ANNEALING, AND DIELECTRIC PROPERTIES OF EUROPIUM OXIDE THIN FILMSen_US
dc.typeArticleen_US
Appears in Collections:International Journals

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