STRUCTURE, AGING, ANNEALING, AND DIELECTRIC PROPERTIES OF EUROPIUM OXIDE THIN FILMS

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DC Field	Value	Language
dc.contributor.author	Meena P	-
dc.contributor.author	Balasubramanian C	-
dc.contributor.author	Narayandass K	-
dc.contributor.author	Mangalaraj D	-
dc.date.accessioned	2020-09-25T06:49:04Z	-
dc.date.available	2020-09-25T06:49:04Z	-
dc.date.issued	1991	-
dc.identifier.issn	1862-6300	-
dc.identifier.uri	https://onlinelibrary.wiley.com/doi/abs/10.1002/pssa.2211250243	-
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/1674	-
dc.description.abstract	Since very few reports are available on europium oxide (Eu2O3) thin films, further investigations on structure, aging, and annealing of Eu2O3 films are necessary. Hence the present study deals with the structure, aging, annealing, and dielectric properties of Eu2O3 thin films formed by vacuum evaporation.	en_US
dc.language.iso	en	en_US
dc.publisher	Wiley/Physica Status Solidi (a), K97-K100	en_US
dc.subject	Eu2O3thin films	en_US
dc.title	STRUCTURE, AGING, ANNEALING, AND DIELECTRIC PROPERTIES OF EUROPIUM OXIDE THIN FILMS	en_US
dc.type	Article	en_US
Appears in Collections:	International Journals

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