Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/1923
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dc.contributor.authorS N, Vidhya-
dc.contributor.authorO N, Balasundaram-
dc.contributor.authorM, Chandramohan-
dc.date.accessioned2020-10-01T10:06:06Z-
dc.date.available2020-10-01T10:06:06Z-
dc.date.issued2015-09-
dc.identifier.issn0030-4026-
dc.identifier.urihttps://www.journals.elsevier.com/optik-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/1923-
dc.description.abstractCadmium zinc telluride (CdZnTe) thin films were grown on glass substrates by the chemical bath deposi-tion. The films were annealed in air for 1 h at various temperatures (300◦C, 400◦C and 500◦C). The grownfilms were analyzed by X-ray diffraction, scanning electron microscopy and UV spectra. X-ray diffrac-tion studies reveal that films are polycrystalline in nature with rhombohedral structure. The structuralparameters such as grain size, dislocation density and micro strain were evaluated. SEM analysis at hightemperature indicates the hexagonal face like rod structure. Optical transmittance study shows the widetransmittance with the band gap energy decreasing, from 2 to 1.75 eV.en_US
dc.language.isoenen_US
dc.publisherElsiever - Optiken_US
dc.subjectThin filmsen_US
dc.subjectChemical bathen_US
dc.subjectStructural propertiesen_US
dc.subjectOptical propertiesen_US
dc.titleTHE EFFECT OF ANNEALING TEMPERATURE ON STRUCTURAL, MORPHOLOGICAL AND OPTICAL PROPERTIES OF CDZNTE THIN FILMSen_US
dc.typeArticleen_US
Appears in Collections:International Journals



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